TSMC Tapeout 后,反馈 FSR (Foundry Service Request From)文件去做检查;
参考资料:T-018-CV-DR-032 Version 1.4_1
Mask ID | Ver. | Mask Name | |||
---|---|---|---|---|---|
1 | 112 | A | BURIED-N-IMP | NBL | N+ Buried Layer |
2 | 120 | A | OD1-ETCH | OD | Thin oxide for device and interconnection(1.8V器件) |
3 | 121 | A | ODR-ETCH | ODR | Reverse thin oxide 不存在BIG OD 或者OD Density < 65% 时可以不使用ODR T-000-CV-DR-004, Version=0.3 |
4 | 19C | A | WELL-P-DEEP-IMP | DPW | Deep P-Well |
5 | 191 | A | WELL-P-IMP | 1.8V P-Well | |
6 | 193 | A | WELL-P-I/O-IMP | 5V P-Well | |
7 | 192 | A | WELL-N-IMP | 1.8V N-Well | |
8 | 194 | A | WELL-N-I/O-IMP | 5V N-Well | |
9 | 11A | A | DDD-P-IMP | PDD | Double Diffusion Drain |
10 | 11B | A | DDD-N-IMP | NDD | Double Diffusion Drain |
11 | 132 | A | OD2-ETCH | Thick oxide for device | |
12 | 143 | A | PBODY-ETCH | HVPB | p-body for NLDMOS |
13 | 130 | A | POLY-GATE-ETCH | PO | Poly for device and interconnection |
14 | 114 | A | LDD-N-CORE-IMP | N2V | 5V Lightly Doped Drain |
15 | 113 | A | LDD-P-CORE-IMP | P2V | 5V Lightly Doped Drain |
16 | 115 | A | LDD-P-I/O-IMP | N5V | 1.8V Lightly Doped Drain |
17 | 116 | A | LDD-N-I/O-IMP | P5V | 1.8V Lightly Doped Drain |
18 | 198 | A | S/D-N-IMP | NP | N+ implantation |
19 | 197 | A | S/D-P-IMP | PP | P+ implantation |
20 | 155 | A | RPO-ETCH | RPO | Salicide protection |
21 | 156 | A | CONTACT-METAL-ETCH | CO | contact window from M1 to OD or PO |
22 | 160 | A | METAL1-ETCH | ||
23 | 183 | A | HRM1-SICR-ETCH | Thin Film Resistor,材料为 SiCr,做在M1/M2之间,通过VIA12到M2引出 | |
24 | 167 | A | HRM2-SICR-ETCH | Thin Film Resistor,需要2层Mask | |
25 | 178 | A | VIA1-ETCH | ||
26 | 180 | A | METAL2-ETCH | ||
27 | 179 | A | VIA2-ETCH | ||
28 | 181 | A | METAL3-ETCH | ||
29 | 173 | A | VIA3-ETCH | ||
30 | 184 | A | METAL4-ETCH | ||
31 | 174 | A | VIA4-ETCH | ||
32 | 182 | A | CAPACITOR-MET-TOP-ETCH | capacitor top metal | |
33 | 185 | A | METAL5-ETCH | ||
34 | 107 | A | PASSIVATION-PAD-ETCH | Passivation pad opening | |
35 | 009 | A | POLYIMIDE-NEGATIVE-PHO | Polymide Window for |